Download e-book for kindle: Advanced Computing in Electron Microscopy by Earl J. Kirkland

By Earl J. Kirkland

ISBN-10: 1475744064

ISBN-13: 9781475744064

ISBN-10: 1475744080

ISBN-13: 9781475744088

Preface to moment variation a number of new themes were extra, a few small mistakes were corrected and a few new references were further during this version. New issues contain aberration corrected tools, scanning confocal mode of operations, Bloch wave eigenvalue tools and parallel computing options. The ?rst variation - cluded a CD with laptop courses, which isn't integrated during this variation. - stead the linked courses can be to be had on an linked website (currently˜kirkland,but may perhaps movement as time is going on). I desire to thank Mick Thomas for getting ready the specimen used to list the picture in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an attractive organic specimen to take advantage of in Fig.7.24. back, I ask for forgiveness upfront for leaving out a few undoubtedlyoutstanding r- erences. I additionally ask for forgiveness for the as but undiscovered error that stay within the textual content. Earl J. Kirkland, December 2009 Preface to First version snapshot simulation has turn into a standard instrument in HREM (High answer El- tron Microscopy) in recent times. besides the fact that, the literature at the topic is scattered between many various journals and convention complaints that experience happened within the final or 3 many years. it's dif?cult for newcomers to start during this ?eld.

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18) where k,a = (3/).. and (3 is the angle of the incident illumination (with respect to the 26 CHAPTER 3. 4: Imaging with non-ideal illumination. The incident electrons have an angle (3. The specimen scatters at an angle )'k and the final angle into the objective lens is 0 (angles measured with respect to the optic axis). A single electron trajectory is shown on the left and the total illumination of a single point on the image is shown on the right. (3max is typically the condenser aperture and Omax is the objective aperture.

Kak, Digital Picture Processing, Academic Press, 1976 102 9. W. O. Saxton, Computer Techniques for Image Processing in Electron Microscopy, Adv. 8 An FFT Subroutine in C 1*------------------------ fft42 -------------------------radix-4,2 FFT in C fft42( fr[] , fiE], n ) fr[], fi[] n (float) real and imaginary array with input data (long) size of array calculate the complex fast Fourier transform of (fr,fi) input array fr,fi (real,imaginary) indexed from 0 to (n-l) on output fr,fi contains the transform started 8-jan-1995 E.

When N is decomposed into both factors of 2 and 4 the FFT is said to be a mixed radix FFT. It would first do all of the factors of 4 and then at most one factor of 2 to get any length that is a power of 2. If a two dimensional (or higher) FFT is needed, an additional improvement in performance can also be obtained by using a look up table for the sines and cosines because they only need to be calculated once. Higher radix FFT's generally trade integer operations for floating point operation. Until recently floating point operations were almost always much slower than integer operation and higher radix FFT's run faster.

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Advanced Computing in Electron Microscopy by Earl J. Kirkland

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